Time-of-flight photoelectron emission microscopy TOF-PEEM: first results

Spiecker H, Schmidt O, Ziethen C, et al. Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. 1998;406(3):499-506.The time structure of the synchrotron radiation at BESSY (Berlin) is used to operate a photoemission electron microscope in a time-of-flight (TOF) mode. The electrons which are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. The screen of the microscope was replaced by a fast scintillator (tau = 1.4 ns) and the light is detected by an ultra fast gated intensified CCD camera (800 ps gate 1 MHz repetition rate). The resolving power in the energy domain is demonstrated and possible implications on the spatial resolution (chromatic correction) are discussed. Additionally, an improved contrast at very low emission energies is shown. The capability of the setup as an efficient microspectroscopic tool is illustrated. (C) 1998 Elsevier Science B.V. All rights reserved